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EVS-EN IEC 62496-2-5:2023

Optical circuit boards - Basic test and measurement procedures - Part 2-5: Flexibility test for flexible opto-electric circuits

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Kehtiv alates 01.02.2023
Alusdokumendid
IEC 62496-2-5:2022; EN IEC 62496-2-5:2023
Tegevusala (ICS grupid)
33.180.01 Kiudoptiline side
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Staatus
Kuupäev
Tüüp
Nimetus
01.02.2023
Põhitekst
This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress test method for finding the predetermined minimum mechanical folding radii below which the flexible opto-electric circuits can be damaged by intended folding distortion. Here, test samples are used instead of products for the flexibility test of their flexible opto-electric circuits, and the test samples have the same layer structure as the products.

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