Infoteenus
Uued standardid
This document requires the assessment of hazard level at each accessible location of the OFCS as a replacement for product classification according to IEC 60825-1. It applies to the installed OFCS as an engineered, end-to-end assembly for the generation, transfer and receipt of optical radiation arising from lasers, light-emitting diodes (LEDs) or optical amplifiers, in which the transference is by means of optical fibre for communication and/or control purposes.
NOTE 1 Throughout this document, a reference to 'laser' is taken to include LEDs and optical amplifiers.
Individual components and subassemblies that fall under the definition of a laser product are subject to the applicable subclause(s) of IEC 60825-1. This document is applicable to individual components and subassemblies intended to be installed within OFCSs.
This document does not apply to optical fibre systems primarily designed to transmit optical power for applications such as material processing or medical treatment.
In addition to the hazards resulting from laser radiation, OFCSs possibly give rise to other hazards, such as fire.
This document does not address safety issues associated with explosion or fire with respect to OFCSs deployed in explosive atmospheres.
NOTE 2 The hazard presented by optical radiation emerging from a fibre is determined by the wavelength and power emerging from the fibre and also by the optical characteristics of the fibre itself (see Annex A).
This edition includes the following significant technical changes with respect to the previous edition:
a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;
b) some formulae in the first edition have been corrected.
This document has the status of a horizontal publication in accordance with IEC Guide 108.
The IEC 61360-7 data dictionary is published in IEC CDD and is available at https://cdd.iec.ch.
This edition includes the following significant technical changes with respect to the previous edition:
- addition of multiple-folding;
- addition of new data analysis logic.
NOTE The measurement methods of dimensions of the shape patterns considering three-dimensional characteristics can be developed later after the measurement methods for vertical variance are established.
NOTE Background of this document and its relation to currently existing standards, e.g. IEC 60749‑20 or J-STD-020F and J-STD-033, are described in the Introduction.
This edition includes the following significant technical changes with respect to the previous edition:
a) The content is updated to cover the classification conditions given in the new editions of J-STD-020F and IEC 60068-2-58.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of optional ADHP PPAP;
b) revision to Annex B; addition of Annex C and Annex D;
c) removal of STACK;
d) general update to referenced standards throughout.
By collecting the existing standards of electrochemical capacitor , this document identifies the gap between the existing IEC and ISO standards and the actual needs of electrochemical capacitors used in EES and proposes descriptions and a roadmap for future standardization of electrochemical capacitors in the field of EES. This work will promote the rapid progress and broader applications of electrochemical capacitors in the field of EES.
This edition includes the following significant technical changes with respect to the previous edition:
a) add writing characteristics as physical properties of interaction between a pen and a surface of a screen;
b) add example of frictional response between paper and pencil, AGL and touch pen, and glass and touch pen;
c) add example of touch display used in the classroom regarding writing and optical characteristics.
Asendatud standardid
This standard applies to devices intended for reflow soldering, like surface mount devices, including specific through-hole devices (where the device supplier has specifically documented support for reflow soldering), but not to semiconductor devices and devices for flow (wave) soldering.
- refers to the latest editions of IEC TS 62239-1 and IEC TS 62686-1, and of other publications;
- adds information regarding components' life expectancy.
This consolidated version consists of the first edition (2015) and its amendment 1 (2018). Therefore, no need to order amendment in addition to this publication.
This document specifies the temperature cycling test method which takes into account the actual usage conditions of discrete type power electronic devices to evaluate reliability of the die attach joint materials and joining system, and establishes a classification level for joining reliability (reliability performance index).
The test method specified in this document is not intended to evaluate power semiconductor devices themselves.
The test method specified in this document is not regarded as the one for use to guarantee the reliability of the power semiconductor device packages.
NOTE The test result obtained using this document will not be used as absolute quantitative data, but for intercomparison with the other die attach materials results using the same setup.
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Connectors designed for use at radio frequencies are not covered.
It shall be used in conjunction with IEC GUIDE 109:2003 that advocates the need to minimize the impact of a product on the natural environment throughout the product life cycle.
It is understood that some materials permitted by this specification and in manufacturing and assembly processes may have a negative environmental impact. As technological advances lead to acceptable alternatives for these materials, they shall be eliminated from this specification. Inappropriate manufacturing processes should be replaced by a product design that features easy maintainability and disassembly.
In the event of conflict between this part of IEC 61076 and the sectional product specification, the requirements of the sectional product specification prevail.
NOTE 1 The quality assessment requirements for connectors according to the IEC 61076 series are detailed in IEC 62197-1:2006 [1].
NOTE 2 A detail quality specification, future IEC 62197-3-1XX should be prepared, based on the blank detail quality specification for rectangular connectors, future IEC 62197-3-001:2006 [2], and should be used in conjunction with the detail product specification IEC 61076-3-1XX.
IEC 62635 provides a method to calculate the material recyclability rate of electrical and electronic equipment (EEE) during the design phase using material recycling rate data based on EoL treatment scenarios. It also provides a method to calculate material recoverability rate based on material recovery rate data. This document sets up criteria and a format to describe the EoL treatment scenarios. Additionally, the method can be also applied for the calculation of recyclability and recoverability of materials of interest such as CRMs.
To achieve the above, this document addresses:
– A default EoL treatment scenario for material recycling and for material recovery,
– Examples of EoL treatment scenarios and the corresponding material recovery and material recycling rates,
– Provisions for product information from manufacturers to EoL treatment operators to improve material recycling and recovery rates,
– Provisions for EoL treatment information from EoL treatment operators to manufacturers to build EoL treatment scenarios.
This document does not address the recovery of products and parts for reuse and product packaging.
It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.