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EVS-EN 60749-13:2003

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

General information
Withdrawn from 03.05.2018
Base Documents
IEC 60749-13:2002; EN 60749-13:2002
Directives or regulations
None

Standard history

Status
Date
Type
Name
03.05.2018
Main
01.03.2003
Main
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
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