Skip to main content
Back

EVS-EN 60749-23:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

General information

Withdrawn from 16.02.2026
Base Documents
IEC 60749-23:2004; EN 60749-23:2004
Directives or regulations
None

Standard history

Status
Date
Type
Name
16.02.2026
Main
05.04.2011
Amendment
09.07.2004
Main
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Required fields are indicated with *

*
*
*
PDF
19.84 € incl tax
Paper
19.84 € incl tax
Browse standard from 2.48 € incl tax
Standard monitoring

Customers who bought this item also bought

Main

EVS-EN ISO 1043-3:2016

Plastics - Symbols and abbreviated terms - Part 3: Plasticizers (ISO 1043-3:2016)
Newest version Valid from 06.12.2016
Amendment

EVS-EN 60749-23:2004/A1:2011

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Withdrawn from 16.02.2026
Main

EVS-EN ISO/IEC 30111:2020

Information technology - Security techniques - Vulnerability handling processes (ISO/IEC 30111:2019)
Newest version Valid from 15.06.2020
Main

EVS-EN IEC 60664-1:2020

Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests
Valid from 17.08.2020