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EVS-EN IEC 60749-23:2026

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

General information

Valid from 16.02.2026
Base Documents
EN IEC 60749-23:2026; IEC 60749-23:2025
ICS Groups
31.080.01 Semiconductor devices in general
Directives or regulations
None

Standard history

Status
Date
Type
Name
16.02.2026
Main
EVS-EN IEC 60749-23:2026
05.04.2011
Amendment
EVS-EN 60749-23:2004/A1:2011
09.07.2004
Main
EVS-EN 60749-23:2004
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as “burn-in”, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this standard.

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Standards designation

EVSEstonian standard
ENEuropean standard (published by an CEN or CENELEC)
EN ISOInternational standard adopted as an European standard
ISOInternational Organization for Standardization’s standard
IECInternational Electrotechnical Commission’s standard
HDCENELEC’s harmonisation document
EVS-ENEuropean standard implemented in Estonia
EVS-EN ISOInternational standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IECInternational standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IECInternational electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
 
A, AMDamedment
+Aa full standard plus the amendment
/Aonly amendment
COR, ACcorrigendum
+CORa full standard plus the corrigendum
NAnational annex
+NAa full standard plus the national annex
/NAonly national annex
TStechnical specification
TRtechnical report
CWAagreement, developed by a CEN or CENELEC
prEVS-EN (etc)draft standard
 
etthe standard is in Estonian only
enthe standard is in English only
et-enthe standard is in Parallel text Estonian-English