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EVS-EN 60749-4:2003

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

General information
Withdrawn from 05.07.2017
Base Documents
IEC 60749-4:2002; EN 60749-4:2002
Directives or regulations
None

Standard history

Status
Date
Type
Name
05.07.2017
Main
01.03.2003
Main
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
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