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EVS-EN 60749-6:2003

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

General information
Withdrawn from 05.07.2017
Base Documents
IEC 60749-6:2002; EN 60749-6:2002
Directives or regulations
None

Standard history

Status
Date
Type
Name
05.07.2017
Main
01.03.2003
Main
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
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