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EVS-EN 60749-8:2003

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

General information
Valid from 07.11.2003
Base Documents
IEC 60749-8:2002; EN 60749-8:2003
Directives or regulations
None

Standard history

Status
Date
Type
Name
07.11.2003
Main
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices
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