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EVS-EN 61000-4-29:2002

Electromagnetic Compatibility (EMC) - Part 4-29: Testing and measurement techniques; Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

General information
Valid from 01.01.2003
Base Documents
IEC 61000-4-29:2000; EN 61000-4-29:2000
Directives or regulations
None
Standard history
Status
Date
Type
Name
01.01.2003
Main
This part of IEC 61000 defines the test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low voltage d.c. power ports of equipment supplied by external d.c. networks. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. input power ports.
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