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EVS-EN 61189-5-503:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

General information
Valid from 16.08.2017
Base Documents
IEC 61189-5-503:2017; EN 61189-5-503:2017
Directives or regulations
None
Standard history
Status
Date
Type
Name
16.08.2017
Main
IEC 61189-5-503:2017(E) specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
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Standard monitoring