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EVS-EN 61967-4:2003

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

General information
Withdrawn from 17.05.2021
Base Documents
IEC 61967-4:2002; EN 61967-4:2002
Directives or regulations
None
Standard history
Status
Date
Type
Name
17.05.2021
Main
02.08.2017
Corrigendum
05.07.2006
Amendment
01.03.2003
Main
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
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