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EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

General information
Valid from 07.12.2005
Base Documents
IEC 61967-2:2005; EN 61967-2:2005
Directives or regulations
None
Standard history
Status
Date
Type
Name
07.12.2005
Main
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell.
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