Back

EVS-EN 62132-2:2011

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

General information
Valid from 05.04.2011
Base Documents
IEC 62132-2:2010; EN 62132-2:2011
Directives or regulations
None

Standard history

Status
Date
Type
Name
05.04.2011
Main
This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
*
*
*
PDF
19.52 € incl tax
Paper
19.52 € incl tax
Browse standard from 2.44 € incl tax
Standard monitoring

Customers who bought this item also bought

Main

EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Newest version Valid from 07.12.2005
Main

EVS-EN 62132-4:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method
Newest version Valid from 07.09.2006
Main

EVS-EN 62132-5:2006

Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 5: Workbench Faraday cage method
Newest version Valid from 08.03.2006
Main

EVS-EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Newest version Valid from 03.10.2012