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EVS-EN IEC 63364-1:2023

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection

General information
Valid from 01.02.2023
Base Documents
EN IEC 63364-1:2023; IEC 63364-1:2022
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.02.2023
Main
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
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