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EVS-EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

General information

Valid from 02.02.2026
Base Documents
IEC 63616:2025; EN IEC 63616:2026
Directives or regulations
None

Standard history

Status
Date
Type
Name
02.02.2026
Main
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

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