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EVS-EN ISO 12179:2000

Geometrical Product Specifications (GPS) - Surface texture: Profil method - Calibration of contact (stylus) instruments

General information
Valid from 01.10.2000
Base Documents
ISO 12179:2000; EN ISO 12179:2000
Directives or regulations
None
Standard history
Status
Date
Type
Name
07.11.2008
Corrigendum
01.10.2000
Main
This International Standard applies to to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profil method as defined in ISO 3274.
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PDF
10.19 €
Paper
10.19 €
Price: 2.00 €
Standard monitoring