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EVS-EN ISO 12179:2022

Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)

General information
Valid from 01.02.2022
Base Documents
ISO 12179:2021; EN ISO 12179:2022
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.02.2022
Main
07.11.2008
Corrigendum
01.10.2000
Main
This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
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