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EVS-EN ISO 8785:2001

Geometrical product specifications (GPS) - Surface imperfections - Terms, definitions and parameters

General information

Valid from 01.07.2001
Base Documents
ISO 8785:1998; EN ISO 8785:1999
ICS Groups
01.040.17 Metrology and measurement. Physical phenomena (Vocabularies) 17.040.20 Properties of surfaces
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.07.2001
Main
EVS-EN ISO 8785:2001
This International Standard defines terms relating to surface imperfections in order to establish a common vocabulary to be used in technical  documents, technical drawings, scientific publications, etc. to specify to  what extent surface imperfections are allowed and to aid in the  specification of methods of measuring surface imperfections.

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English (PDF 91 KB)

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Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English