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EVS-EN ISO 9220:1999

Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

General information
Withdrawn from 15.03.2022
Base Documents
ISO 9220:1988; EN ISO 9220:1994
Directives or regulations
None

Standard history

Status
Date
Type
Name
15.03.2022
Main
01.01.2000
Main
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.
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