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IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

General information

Valid from 30.08.2002
Directives or regulations
None

Standard history

Status
Date
Type
Name
30.08.2002
Main
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

The contents of the corrigendum of August 2003 have been included in this copy.

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