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IEC 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

General information

Withdrawn from 15.02.2018
Directives or regulations
None

Standard history

Status
Date
Type
Name
15.02.2018
Main
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.

The contents of the corrigendum of August 2003 have been included in this copy.

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