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IEC 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

General information

Withdrawn from 28.03.2019
Directives or regulations
None

Standard history

Status
Date
Type
Name
28.03.2019
Main
20.02.2003
Main
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

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