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IEC 61010-2-032:2023 EXV

Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 2-032: Particular requirements for hand-held and hand-manipulated current sensors for electrical test and measurement

General information
Valid from 20.09.2023
Directives or regulations
None

Standard history

Status
Date
Type
Name
20.09.2023
Main
IEC 61010-2-032:2023 EXV contains both the international standard and its extended version (EXV). This extended version of the official IEC Standard is available in English only and provides the user with the comprehensive content of the Standard. IEC 61010-2-032:2023 EXV includes the content of the references made to IEC 61010-1:2010 and IEC 61010-1:2010/AMD1:2016.

IEC 61010-2-032:2023 EXV specifies safety requirements for hand-held and hand-manipulated current sensors intended for measuring, detecting or injecting current, or indicating current waveforms on circuits without physically opening the current path of the circuit being measured.
These current sensors are hand-manipulated before and/or after a test or measurement, but are not necessarily hand-held during the test or measurement. They can be stand-alone current sensors or accessories to other equipment or parts of combined equipment. These include measurement circuits which are part of electrical test and measurement equipment, laboratory equipment, or process control equipment.
This fifth edition cancels and replaces the fourth edition published in 2019. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) In 1.1.1, definitions of current sensor types have been moved to a new Annex FF;
b) Clause 2, all normative references have been dated and new normative references have been added;
c) 3.2.103, a new definition protective fingerguard has been added which replaces the previous definition of protective barrier;
d) 4.4.2.101 is a new subclause about surge protective devices;
e) in 5.1.5.101.2, minimum ratings for voltage of measuring terminals are required;
f) Subclause 6.5.1 has been modified;
g) Subclause 6.5.5 is no longer used;
h) Subclause 6.6.101 modifies 6.6.101 and 6.6.102 of previous edition:
1) in 6.6.101.1, insulating material of group I may be allowed for determination of creepage distances of measuring circuit terminals;
2) in 6.6.101.2, clearances and creepage distances up to 3 000 V for measuring circuit terminals in unmated position have been defined;
3) in 6.6.101.3, requirements for measuring circuit terminals in partially mated position have been specified;
4) in 6.6.101.4, requirements for measuring circuit terminals in mated position have been specified;
5) Subclause 6.6.101.5 replaces 6.6.102;
i) Subclause 6.6.102 replaces 6.101 of previous edition with modifications;
j) Subclause 6.101.2 replaces 6.9.101.1 of previous edition with modifications;
k) Subclause 6.101.3 replaces 6.9.101.2 of previous edition with modifications;
l) Subclause 6.101.4 replaces 6.9.102 of previous edition with modifications;
m) in 8.101, jaw ends abrasion test has been modified;
n) 8.105 is a new subclause for input/output leads attachment has been added;
o) in 9.101.2, relocation of 101.3 of previous edition;
p) in 9.101.3, relocation of 101.4 of previous edition, extension to measurement category II and reference to IEC 61000-4-5 for tests:
q) Table 104 has been replaced by Table K.101:
r) in 9.102, relocation of Clause 102 of previous edition;
s) in 14.101, relocation of 14.102. Subclause 14.101 of previous edition has been deleted;
t) 101.3 is a new subclause for protections against hazard occurring from reading a voltage value in replacement of Clause EE.5 of previous edition;
u) in Table D.101, transients are disregarded for insulation between jaw ends and input/output circuits;
v) in Clause F.101, test voltages for routine test of jaws have been modified;
w) in K.2.1, another method for determination of clearances of secondary circuits is proposed;
x) in K.3.2, new Table K.15 and Table K.16 for clearance calculation;
y) K.3.101 is a new clause;
z) Clause K.4, redraft of the clause to propose a method for determination of Ut for circuits which reduce transient overvoltages;
aa) Table K.101 replaces Table 104;
bb) Subclause K.101.4 has been reviewed and tables and tests for solid insulation have been modified;
cc) Table K.104 of previous edition has been deleted;
dd) Annex AA: Figure AA.1 has been redesigned;
ee) Annex EE: addition of a new informative annex for determination of clearances for Table 101;
ff) Annex GG: this annex was Annex EE of previous edition and the current sensor type of a clamp multimeter is type A or type B.
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