Skip to main content
Back

IEC 62047-16:2015

Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

General information

Valid from 05.03.2015
Directives or regulations
None

Standard history

Status
Date
Type
Name
05.03.2015
Main
IEC 62047-16:2015 specifies the test methods to measure the residual stresses of films with thickness in the range of 0,01 μ to 10 μ in MEMS structures fabricated by wafer curvature or cantilever beam deflection methods.

Required fields are indicated with *

*
*
*
PDF
52.45 € incl tax
Paper
52.45 € incl tax
Standard monitoring