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IEC TS 61945:2000

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

General information

Valid from 10.03.2000
Directives or regulations
None

Standard history

Status
Date
Type
Name
10.03.2000
Main
Gives the methodology for technology and failure analysis in manufacturing integrated circuits.
Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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