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IEC TS 62607-6-14:2020

Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

General information
Valid from 27.10.2020
Directives or regulations
None
Standard history
Status
Date
Type
Name
27.10.2020
Main
IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic • defect level for powders consisting of graphene-based material by • Raman spectroscopy. The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D. • The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder. • The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene. • Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users. • The method described in this document is appropriate if the physical form of graphene is powder.
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