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prEN IEC 62276:2024

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

General information

Draft
Base Documents
49/1454/CDV; prEN IEC 62276:2024
Directives or regulations
None

Standard history

Status
Date
Type
Name
Main
prEN IEC 62276:2024
03.01.2017
Main
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

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Standard monitoring