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EVS-EN 62276:2016

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

General information
Valid from 03.01.2017
Base Documents
IEC 62276:2016; EN 62276:2016
Directives or regulations
None
Standard history
Status
Date
Type
Name
03.01.2017
Main
05.02.2013
Main
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.
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