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EVS-EN 60749-2:2003

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

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Kehtiv alates 01.03.2003
Alusdokumendid
IEC 60749-2:2002; EN 60749-2:2002
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
01.03.2003
Põhitekst
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.
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