EVS-EN 61338-1-5:2015

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition:

a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;

b) changes to normative references;

c)addition to bibliography.