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EVS-EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

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Kehtiv alates 03.10.2012
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IEC 62132-8:2012; EN 62132-8:2012
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03.10.2012
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This part of IEC 62132 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
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EVS-EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Uusim versioon Kehtiv alates 02.11.2011
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EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Uusim versioon Kehtiv alates 07.12.2005
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EVS-EN 62132-4:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method
Uusim versioon Kehtiv alates 07.09.2006
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EVS-EN 62132-5:2006

Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 5: Workbench Faraday cage method
Uusim versioon Kehtiv alates 08.03.2006