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EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

Üldinfo
Kehtiv alates 07.12.2005
Alusdokumendid
IEC 61967-2:2005; EN 61967-2:2005
Tegevusala (ICS grupid)
31.080.99 Muud pooljuhtseadised
Direktiivid või määrused
puuduvad
Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
07.12.2005
Põhitekst
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell.
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EVS-EN 62132-2:2011

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Uusim versioon Kehtiv alates 05.04.2011
Põhitekst

EVS-EN 62132-4:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method
Uusim versioon Kehtiv alates 07.09.2006
Põhitekst

EVS-EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Uusim versioon Kehtiv alates 03.10.2012
Põhitekst

EVS-EN 61967-4:2003

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Kehtetu alates 17.05.2021