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EVS-EN IEC 61967-8:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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Kehtiv alates 15.06.2023
Alusdokumendid
IEC 61967-8:2023; EN IEC 61967-8:2023
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Staatus
Kuupäev
Tüüp
Nimetus
15.06.2023
Põhitekst
02.11.2011
Põhitekst
IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

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