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EVS-EN IEC 61967-1:2019

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

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Kehtiv alates 01.03.2019
Alusdokumendid
IEC 61967-1:2018; EN IEC 61967-1:2019
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Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
01.03.2019
Põhitekst
01.03.2003
Põhitekst
This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967.
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EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Uusim versioon Kehtiv alates 07.12.2005
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EVS-EN 61967-4:2003

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Kehtetu alates 17.05.2021
Muudatus

EVS-EN 61967-4:2003/A1:2006

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Kehtetu alates 17.05.2021
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EVS-EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Uusim versioon Kehtiv alates 02.11.2011