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EVS-EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

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Kehtiv alates 01.06.2023
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IEC 63287-2:2023; EN IEC 63287-2:2023
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01.06.2023
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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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