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ISO 23699:2026

Microbeam analysis — Electron backscatter diffraction — Vocabulary

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Kehtiv alates 28.09.2026
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28.09.2026
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This document defines terms used for the electron backscatter diffraction (EBSD) technique. This document covers both general and specific concepts classified according to their hierarchy in a systematic order.
This document is applicable to standardization documents relevant to EBSD practices. In addition, some definitions in this document are applicable to transmission Kikuchi diffraction (TKD).

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