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ISO 9220:1988

Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method

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Kehtetu alates 11.02.2022
Tegevusala (ICS grupid)
25.220.40 Metallpinded
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
11.02.2022
Põhitekst
29.09.1988
Põhitekst
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

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