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EVS-EN 60749-10:2003

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

General information
Withdrawn from 15.06.2022
Base Documents
IEC 60749-10:2002; EN 60749-10:2002
Directives or regulations
None

Standard history

Status
Date
Type
Name
15.06.2022
Main
01.03.2003
Main
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.
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