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EVS-EN 165000-3:2002

Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers

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Kehtiv alates 01.01.2003
Alusdokumendid
EN 165000-3:1996
Direktiivid või määrused
puuduvad
Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
01.01.2003
Põhitekst
This specification prescribes the quality assessment procedures and methods of tests to be used in the assessment of film and hybrid integrated circuits intended for use in electronic equipment, under the capability approval procedure. It also applies to part completed devices supplied to customers for subsequent processing. It should be read in conjunction with EN 165000-1, -2 and -4.
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