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EVS-EN 62047-3:2006

Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile-testing

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Kehtiv alates 06.11.2006
Alusdokumendid
IEC 62047-3:2006; EN 62047-3:2006
Tegevusala (ICS grupid)
31.080.99 Muud pooljuhtseadised
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Standardi ajalugu

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Kuupäev
Tüüp
Nimetus
06.11.2006
Põhitekst
This International Standard specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 μm, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. This International Standard is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.

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EVS-EN 62047-2:2006

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EVS-EN 62047-6:2010

Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials
Uusim versioon Kehtiv alates 06.05.2010