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EVS-EN IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

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Kehtiv alates 15.09.2020
Alusdokumendid
IEC 60749-41:2020; EN IEC 60749-41:2020
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Standardi ajalugu
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Tüüp
Nimetus
15.09.2020
Põhitekst
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
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