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EVS-EN ISO 3868:1999

Metallic and other non-organic coatings - Measurement of coating thicknesses - Fizeau multiple-beam interferometry method

General information

Valid from 01.01.2000
Base Documents
ISO 3868:1976; EN ISO 3868:1994
ICS Groups
17.040.20 Properties of surfaces
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.01.2000
Main
EVS-EN ISO 3868:1999
Specifies a method for the measurement of the thickness of thin, highly reflective coatings (up to 2 ) by the use of Fizeau muliple-beam interferometry. The method described cannot be applied to vitreous enamel coatings. Gives principle, definitions, equipment, factors affecting in the measuring accuracy, calibration, procedure and measuring precision.

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Standard monitoring
English (PDF 95 KB)

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Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English