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IEC TS 62804-2:2022

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film

General information
Valid from 29.03.2022
Directives or regulations
None
Standard history
Status
Date
Type
Name
29.03.2022
Main
IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID. This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.
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