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EVS-EN 60749-29:2004

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

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Kehtetu alates 06.09.2011
Alusdokumendid
IEC 60749-29:2003; EN 60749-29:2003+AC:2004
Tegevusala (ICS grupid)
31.080 Pooljuhtseadised
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
06.09.2011
Põhitekst
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

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