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EVS-EN 61193-2:2007

Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection of electronic components and packages

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Kehtiv alates 08.01.2008
Alusdokumendid
IEC 61193-2:2007; EN 61193-2:2007
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08.01.2008
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This part of IEC 61193 applies to the inspection of electronic components, packages, and also modules (referred to as “products” in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures. The zero acceptance number sampling plans provided by this standard apply to the inspection of products, that are manufactured under suitable process control with the target of a “zerodefect” quality level before sampling inspection. In addition, this standard provides a method for the calculation of the expected value of the statistical verified quality limit (SVQL) at a confidence level of 60 %. Amongst other things, this method can be used to verify the effectiveness of the supplier’s process control.
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EVS-EN 61193-1:2003

Quality assessment systems - Part 1: Registration and analysis of defects on printed board assemblies
Uusim versioon Kehtiv alates 01.02.2003
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EVS-EN 61193-3:2013

Quality assessment systems - Part 3: Selection and use of sampling plans for printed boards and laminate end-products and in-process auditing (IEC 61193-3:2013)
Uusim versioon Kehtiv alates 04.06.2013