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EVS-EN 61967-4:2003/A1:2006

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

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Kehtetu alates 17.05.2021
Alusdokumendid
IEC 61967-4:2002/A1:2006; EN 61967-4:2002/A1:2006
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Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
17.05.2021
Põhitekst
05.07.2006
Muudatus
01.03.2003
Põhitekst
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
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EVS-EN IEC 61967-1:2019

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Uusim versioon Kehtiv alates 01.03.2019
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EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Uusim versioon Kehtiv alates 07.12.2005
Põhitekst

EVS-EN 61967-4:2003

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Kehtetu alates 17.05.2021
Põhitekst

EVS-EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Uusim versioon Kehtiv alates 02.11.2011