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EVS-EN 60749-24:2004

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

General information
Valid from 09.07.2004
Base Documents
IEC 60749-24:2004; EN 60749-24:2004
Directives or regulations
None

Standard history

Status
Date
Type
Name
09.07.2004
Main
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.  It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
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