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EVS-EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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Kehtetu alates 15.06.2023
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IEC 61967-8:2011; EN 61967-8:2011
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Standardi ajalugu

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Kuupäev
Tüüp
Nimetus
15.06.2023
Põhitekst
02.11.2011
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The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

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EVS-EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Uusim versioon Kehtiv alates 03.10.2012
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EVS-EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Uusim versioon Kehtiv alates 07.12.2005
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EVS-EN 62132-4:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method
Uusim versioon Kehtiv alates 07.09.2006
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EVS-EN IEC 61967-1:2019

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Uusim versioon Kehtiv alates 01.03.2019